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Gentec Electro-Optics Inc   - Measure With Gentec Accuracy LB

OLS3000 LEXT Microscope

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ORANGEBURG, N.Y., June 19, 2006 -- A new laser confocal technology has been announced by Olympus Micro-Imaging that the company said fills the gap between conventional high resolution optical microscopes and scanning electron microscopes (SEMs). Called LEXT for laser scanning confocal technology, it is designed for applications requiring ultraprecise measurement and observation, such as microelectromechanical systems fabrication, advanced materials processing, nanoscale production and semiconductor wafer manufacturing. The new technology, introduced in the OLS3000 LEXT microimaging system, features sub-micron imaging with...See full product

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