Search
Menu
PI Physik Instrumente - Space Qualified Steering LW 1-15 MR

OPTICAL PROFILER

Facebook X LinkedIn Email
Request Info
Nanonics Imaging Ltd.
The NSOM/AFM-100 is a confocal micro-optical profiler that performs beam profiling and characterization for optical component inspection applications. This system from Nanonics Imaging Ltd. utilizes a cantilevered optical fiber probe that scans the microlensed fiber and simultaneously measures the topography of the lens and collects light at each point in the scan with a resolution down to 50 nm. The profiler monitors the distribution of light at various optical planes in micron or submicron steps from above the fiber tip to the focal point.See full product

Related content from Photonics Media



    PRODUCTS


    ARTICLES


    PHOTONICS HANDBOOK ARTICLES


    WHITEPAPERS


    WEBINARS


    PHOTONICS DICTIONARY+ TERMS


    VIDEOS


    PHOTONICS BUYERS' GUIDE CATEGORIES


    COMPANIES


    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.