Request InfoNanoFocus AGOBERHAUSEN, Germany, June 13, 2016 — Nanofocus AG has introduced the μsprint hp-opc 3000 system for the optical inspection of probe cards. The system enables a wafer-production process designed for the requirements of wafer test locations with a variety of different probe cards, as well as large-volume throughput. Probe cards are test devices used for standard function tests of wafers at the end of the front-end process, after the functional structures of the electronic elements on a wafer are fully manufactured. The μsprint hp-opc 3000 system can be used to ensure wafers are in sound condition after testing, for...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 7/7/2023CoaXPress-12 CameraThe 2.0CCX12-CMD2 camera from Mikrotron GmbH features the CoaXPress-12 interface for internal image processing. 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