Request InfoSensofar MetrologyThe S neox optical profiler from Sensofar Metrology is a high-performance, noncontact 3D microscope system designed for subnano, nano, and micro-scale measurement, with advanced inspection and analysis capabilities. With smart algorithms, data acquisition is taken at 180 fps, measures the shape of large rough surfaces, and has been improved to provide a more reliable focus location, even on optically smooth surfaces. A thin-film measurement technique allows the user to quickly, accurately, and nondestructively measure the thickness of optically transparent layers. Transparent films from...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics Sep/Oct 2023 IssueAI-Powered Microscope SoftwareLeica Microsystems’ Aivia 12 software provides AI-powered image analysis. 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