Request InfoInstrument Systems Optische Messtechnik GmbHThe LumiTop 4000 μLED optical wafer test station from Instrument Systems GmbH generates 2D, pixel-resolved optical analyses within given cycle times. The LumiTop 4000 has a resolution of 12 MP and can detect the smallest of defects and inhomogeneities on the wafer. Its 100-mm macro lens enables fast parallel inline analysis of all μLEDs on a wafer at a single test station. The 2D camera is combined with a high-end spectroradiometer that serves as a simultaneous reference measuring instrument for accurate readings. The LumiTop series includes a special version for test objects of...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 12/30/2020Optoelectronic Probe CardThe UFO Probe™ Card from Jenoptik AG is designed for photonic integrated circuit (PIC) wafer-level testing on semiconductor chips. 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