Request InfoJenoptik Optical Systems GmbH, Optical SystemsThe UFO Probe™ Card from Jenoptik AG is designed for photonic integrated circuit (PIC) wafer-level testing on semiconductor chips. The novel optical solution for integration into electrical test cards is insensitive to alignment tolerances in the wafer prober. The card can be used with commercially available wafer probers, ensuring a high throughput for testing photonic integrated circuits and combining electrical and optical tests in one solution. 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