Request InfoRenishaw PLC, Spectroscopy Products Div.The inLux™ scanning electron microscope (SEM) Raman interface from Renishaw PLC enables in situ Raman spectroscopy for highly specific chemical and structural characterization. The interface enables Raman measurements to be performed while the sample is under the SEM beam. This allows simultaneous Raman, photoluminescence, or cathodoluminescence measurements, making experimental workflows easier and faster. The inLux interface is used without any need to move the sample, even when performing mapping measurements.See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra June 2022 IssueYtterbium Femtosecond LasersThe YLMO Mid-IR and YLMO 520 lasers from Menlo Systems GmbH are compact ytterbium femtosecond devices. 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