Request InfoJEOL USA Inc.Nanometer-scale imaging is provid-ed by JEOL USA Inc.'s JSM-7400F scanning electron microscope. The device achieves 1.5-nm resolution at 1 kV. It features a patented scanning electron enhancer for improved contrast quality of surface structures, an r-filter for suppressing the electron charge on nonconductive specimens and an in-lens backscatter detector. Flexible analytical geometry enables a working distance of 8 mm at a takeoff angle of 35°. 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