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SIMS Analyzers

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Hiden Analytical Ltd.
Secondary ion mass spectrometry (SIMS) analyzers for surface characterization from Hiden Analytical are workstations that incorporate instruments for fundamental research through automated quality control applications. The systems feature integrated load lock, sample manipulation and multi-specimen sample carriers. All elements are totally ultra-high-vacuum compatible and feature the Hiden dual-mode MAXIM mass spectrometer operating in the secondary ion detection mode for positive/negative ion detection and in the secondary neutral (SNMS) detection mode for positive data quantification....See full product

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