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PI Physik Instrumente - Space Qualified Steering LW 1-15 MR

SWIR Cameras for PV Inspection

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Sensors Unlimited Inc.
PRINCETON, N.J., June 16, 2009 – Sensors Unlimited Inc., part of Goodrich Corp., has introduced high-resolution shortwave infrared (SWIR) area- and line-scan cameras that are used to improve the manufacturing yield of concentrated photovoltaic cells and to monitor the quality of solar thin films and crystalline cells. The InGaAs-based SWIR cameras, which operate between 0.9 and 1.7 µm, are suitable for inspecting silicon boules and wafers due to that material’s transparency beyond 1.2 µm. The cameras reveal voids in silicon boules, bricks, and ingots before they are sliced into wafers to produce mono- and...See full product

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