Request InfoRigaku Americas Corp.TOKYO, Aug. 2, 2017 — The ZSX Primus 400 sequential wavelength dispersive x-ray fluorescence spectrometer from Rigaku Corp. is designed to handle large or heavy samples and offer micro-mapping capabilities. Such analyzers are notable for high sensitivity and spectral resolution for nondestructive elemental analysis. Accepting samples up to 400 mm in diameter, 50 mm thick and 30 kg in mass, the new system is ideally suited for analyzing sputtering targets, magnetic disks, multilayer film metrology or elemental analysis of large samples. All analytical capabilities of a traditional instrument are retained in...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra July 2023 Issue3D Metrology ScannerThe FreeScan Combo 3D metrology scanner from SHINING 3D Tech Co. Ltd. adopts metrology-grade accuracy, fine scanning, and high precision with a light, compact design. 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