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Vescent Photonics LLC - Lasers, Combs, Controls 4/15-5/15 LB

Thin-Film Metrology System

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k-Space Associates Inc.
The kSA XRF (X-ray fluorescence) tool from k-Space measures film thicknesses below 100 nanometers for applications in coated glass and solar panels. The system uses an X-ray source, detector, and proprietary software to measure the X-ray emission spectrum, which is then used to calculate film thickness in real time. The system can be configured for a standalone benchtop setup or over a conveyor for in-line inspection and manufacturing process control.See full product

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