Request Infok-Space Associates Inc.The kSA XRF (X-ray fluorescence) tool from k-Space measures film thicknesses below 100 nanometers for applications in coated glass and solar panels. The system uses an X-ray source, detector, and proprietary software to measure the X-ray emission spectrum, which is then used to calculate film thickness in real time. The system can be configured for a standalone benchtop setup or over a conveyor for in-line inspection and manufacturing process control.See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 7/3/2023Benchtop X-Ray Diffraction PlatformBruker’s D6 PHASER X-Ray Diffraction (XRD) system is a benchtop XRD platform designed with analytical flexibility typically only available in larger, floor-standing systems. The Motorized Air...BioPhotonics Jul/Aug 2023 IssueCooled sCMOS CamerasXimea’s MJ042MR-GP-P11-BSI-UV model was added to its portfolio of scientific cameras. 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