Request InfoLabsphere Inc.A system that measures the optical and electrical properties of VCSEL wafers has been designed by Labsphere Inc. and Karl Suss America Inc. Designed for high-speed characterization, this turnkey system uses a Spectralon integrating sphere that minimizes sensitivity to beam alignment and divergence and that eliminates reflections that damage the device under test. Measurements include L-I-V curves, optical power, peak wavelength, full width half maximum, kink voltage and current curves, and spectral analysis. The system accepts wafers and substrates up to 200 mm in diameter and provides...See full productRelated content from Photonics MediaWEBINARSPhotonics.com 3/7/2019In Vivo Medical Laser Procedures: An OverviewThis webinar, presented by OFS, will provide an overview of current in vivo medical procedures performed using lasers and optical fibers. The presentation will begin with a brief history of...Photonics.com 10/27/2021Fiber Optic Solutions for Medical DevicesSteve Allen provides a brief overview and examples of procedures that continue to push adoption and proliferation of optical fiber-based medical devices. From cosmetic surgery to cutting-edge sensing...Photonics.com 7/22/2021STANDARDS UPDATE: Vision Standards: An Overview of Global and A3 DevelopmentsStandards play a key role in the vision and imaging industry by ensuring interoperability of components, increasing market size, and shortening the time it takes to get new products to market. As the...Photonics.com 6/30/2021European Photonics Manufacturing Services Funded by ECThis event is supported by the European initiatives presented and is moderated by EPIC, the European Photonics Industry Consortium. The European Commission is helping companies access the...