Request InfoMalvern Panalytical Inc.PANalytical has launched the 2830 ZT, a wafer analyzer that performs simultaneous noncontact determination of layer thickness and composition on wafers up to 300 mm. The wavelength dispersive x-ray fluorescence instrument also determines contamination, dopant levels and surface uniformity, and it measures up to 24 elements on stacks of up to 16 layers. It operates at a constant current of 160 mA and is supplied with the company’s SuperQ software.See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra June 2023 IssueRatio PyrometersThe CSvision series of ratio pyrometers from Optris Infrared Sensing LLC measures the temperature of metals, melts, or ceramics in a safe, noncontact fashion from different distances. 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