Request InfoNanotronicsThe nSpec® TURBO wafer inspection system from Nanotronics acquires images of a 300-mm sample at 1-µm resolution in 45 s. The system enables the high-throughput inspection of wafers ranging from 50 to 300 mm and large panels 10× faster to detect, quantify, and classify defects and features of interest. The system allows for high-volume manufacturers to have a tool with single or multiple load ports that can produce high-resolution images in minutes.See full productRelated content from Photonics MediaPRODUCTSVision Spectra Winter 2022 IssueFrame GrabberThe Claxon Fiber CPXoF frame grabber from BitFlow Inc. is a PCI Express board configured with a single port for QSFP+ hot-swappable, parallel fiber-optical/copper transceiver modules. Equipping...Photonics.com 6/13/2023Linear Voice Coil MotorThe HVCM-051-032-013-01 Linear Voice Coil Motor from Moticont features a high force-to-size ratio and a 19.1-mm stroke. 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