Close

Search

Search Menu
Photonics Media Photonics Marketplace Photonics Spectra BioPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook

Wafer Inspection System

Facebook Twitter LinkedIn Email
Request Info
Hitachi High-Tech Corp.
The DI2800 Dark Field Wafer Defect Inspection System from Hitachi High-Tech Corp. is a high-speed metrology system designed to identify defects and particles on patterned wafers up to 8 in. in diameter. With its high throughput and performance, the DI2800 can help ensure device reliability and safety, particularly for highly sensitive applications such as Internet of Things and automotive fields, where inspection is required. It uses scattering-intensity simulation technology to optimize illumination and detection optics, enabling highly sensitive inspection of patterned-wafer defects...See full product

Related content from Photonics Media



    PRODUCTS


    ARTICLES


    PHOTONICS HANDBOOK ARTICLES


    WHITEPAPERS


    WEBINARS


    PHOTONICS DICTIONARY+ TERMS


    VIDEOS


    PHOTONICS BUYERS' GUIDE CATEGORIES


    COMPANIES


    back to top
    Facebook Twitter Instagram LinkedIn YouTube RSS
    ©2023 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

    Photonics Media, Laurin Publishing
    x Subscribe to Photonics Spectra magazine - FREE!
    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.