Request InfoHitachi High-Tech Corp.The DI2800 Dark Field Wafer Defect Inspection System from Hitachi High-Tech Corp. is a high-speed metrology system designed to identify defects and particles on patterned wafers up to 8 in. in diameter. With its high throughput and performance, the DI2800 can help ensure device reliability and safety, particularly for highly sensitive applications such as Internet of Things and automotive fields, where inspection is required. It uses scattering-intensity simulation technology to optimize illumination and detection optics, enabling highly sensitive inspection of patterned-wafer defects...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 11/25/2021Diode Laser SystemThe DLight®S series diode laser system from Focuslight Technologies is designed for laser wafer annealing in semiconductor manufacturing. 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