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X-ray Fluorescence Spectrometers

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Fischer Technology Inc.
WINDSOR, Conn., Feb. 18, 2010 – The FischerScope X-Ray Conti 5000 instruments manufactured by Fischer Technology Inc. are energy-dispersive x-ray fluorescence spectrometers for in-line process control. They are designed for continuous nondestructive analysis of alloys and for measurement of thin layers and layer systems. The series is best suited for use in the photovoltaics industry to measure the thickness and composition of copper indium gallium selenide, copper indium selenide and cadmium telluride. The photoactive layers on various substrates such as glass panels, thin metals and plastic foils can be measured. ...See full product

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