Request InfoRigaku Americas Corp.Rigaku Americas Corp. has unveiled the Ultima IV x-ray diffractometer, an instrument suitable for materials science and for semiconductor and nanotechnology research. The features include a high-speed detector, application flexibility and a low sample-stage height in an 1100 × 810 × 1630-mm design. Equipped with a Cross Beam Optics mechanism, the device enables users to switch between focusing and parallel incident x-ray beams without resetting the optical system. Geometries are mounted permanently and aligned for simple application changes. A modular buildup platform allows users to increase...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics Jul/Aug 2023 IssueCooled sCMOS CamerasXimea’s MJ042MR-GP-P11-BSI-UV model was added to its portfolio of scientific cameras. 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