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SCANNING CONTROL

nPoint Inc.Request Info
 
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An improved scanning control mode has been introduced by nPoint Inc. for its atomic force microscopes and nanopositioning stages used in research and manufacturing. It incorporates digital signal processing for precision response at high scan speeds and produces minimal phase lag between the commanded and the achieved position. The new mode is available for all of the company's nanopositioning stages, including the iC AFM upgrade kit, which provides closed-loop control and metrology capability to scanning probe instruments.


Photonics Spectra
May 2004
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