Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

SIMS/SNMS Workstation

Photonics Spectra
Nov 2010
Hiden Analytical Ltd.Request Info
 
Hiden Analytical Ltd. has upgraded its SIMS/SNMS (secondary ion mass spectrometry/sputtered neutral mass spectrometry) workstation for high-sensitivity static and dynamic surface analysis. Applications range from photovoltaics, metallurgy, semiconductors and thin-film studies to geology and gemstone characterization. The sample loading and sample transfer stages with fast-entry load lock enable preloading and reloading of multiple samples for optimum cost-effective operational efficiency. The system is fully ultrahigh-vacuum-compliant, and with oxygen, argon and cesium ion sources, provides for broad-beam applications and fine-focus operation to a 20-μm spot size. It also offers elemental analysis of both electropositive and electro-negative species. Included in the system are electron beam charge compensation, a CCD camera and an enclosure. The multiported vacuum chamber is fully accessible for mounting additional accessories.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Hiden Analytical Ltd. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
MORE FROM PHOTONICS MEDIA
semiconductors
argonbroad-beam applicationcamerasCCDCCD cameracesium ionelectron beam charge compensationelectronegative specieselectropositive speciesenclosurefine-focus operationgemstone characterizationgeologyHiden AnalyticalHiden Analytical Ltd.imagingion mass spectrometryload lockmass spectrometrymetallurgymountingNew ProductsoxygenphotovoltaicspreloadingPVsample loadingsample transfer stagesecondary ion mass spectrometry/sputtered neutral mass spectrometrysemiconductorsSIMS/SNMS workstationspectrometryspectroscopysurface analysisTest & Measurementthin-film studiesvacuum chambervacuum compliantworkstation

Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x Subscribe to Photonics Spectra magazine - FREE!
X
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to Hiden Analytical Ltd. so they may respond to your inquiry directly.

Email Address:
Name:
Company:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.