SIMS Analyzers

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Secondary Ion Mass Spectrometry AnalyzersSecondary ion mass spectrometry (SIMS) analyzers for surface characterization from Hiden Analytical are workstations that incorporate instruments for fundamental research through automated quality control applications.

The systems feature integrated load lock, sample manipulation and multi-specimen sample carriers. All elements are totally ultra-high-vacuum compatible and feature the Hiden dual-mode MAXIM mass spectrometer operating in the secondary ion detection mode for positive/negative ion detection and in the secondary neutral (SNMS) detection mode for positive data quantification.

The MASsoft Professional SIMS PC data system enables full control of the mass spectrometer, the ion gun operating parameters and the ion beam raster area and scan rate, with acquired data presented in real time. The ESM LabVIEW SIMS Imaging program acquires, stores and displays the data for presentation in the form of elemental surface maps with both 2D and 3D view capabilities.

Published: February 2017
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ProductsSIMS AnalyzerSecondary Ion Mass Spectrometry AnalyzersHiden AnalyticalEuropeBiophotonicsTest & MeasurementResearch & TechnologySensors & Detectors

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