SPECTROSCOPIC ELLIPSOMETER
Ocean Optics - Part of Ocean InsightRequest Info
The SpecEL-2000-VIS is an easy-to-use benchtop spectroscopic ellipsometer designed for thin-film measurement. Offered by Ocean Optics Inc., the instrument is suitable for working with semitransparent flat samples, such as wafers and glass plates, providing data on the thickness, refractive index, absorption and ratio of film components in a layer of film. The ellipsometer can detect thicknesses between 1 nm and 5 μm and measure refractive indices across the 450- to 900-nm spectral range. The 52 × 33 × 24-cm device features an integrated light source, a spectrometer, two polarizers and a 32-bit Windows-based PC with software that enables experimental methods to be configured and saved for one-step analysis.
https://www.oceanoptics.com
/Buyers_Guide/Ocean_Optics_-_Part_of_Ocean_Insight/c10604
Published: January 2007
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to Ocean Optics - Part of Ocean Insight by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required