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STS Microspectrometers

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DUNEDIN, Fla., Feb. 18, 2011 — Ocean Optics has introduced a family of low-cost, high-performance CMOS detector-based spectrometers that can be embedded into OEM devices.

Measuring 40 × 42 × 24 mm, the instruments perform full spectral analysis with low stray light, a high signal-to-noise ratio of >1500:1 and typical optical resolution of ~1.5 nm FWHM. They are suitable for use in a variety of visible to near-infrared applications including characterization of LEDs and absorbance/transmittance of various samples, and for OEM applications where one or more wavelengths are being monitored and highly reproducible results are required.

The microspectrometers are available in standard models with 350- to 800-nm and 650- to 1100-nm wavelength coverage. Customization of wavelength range, entrance aperture and other optical bench accessories is available for high-volume and OEM customers. A built-in shutter is included for making dark measurements. Operating software is priced separately and provides a full range of spectroscopic functions as well as control of the shutter. Packages for developing customized software are also available.

At the heart of the STS is a 1024-element CMOS detector in a crossed Czerny Turner optical bench. The bench is distinguished by specially designed collimating and focusing mirrors and a 600-lines-per-millimeter groove density grating. Features include 14-bit analog-to-digital resolution and low power consumption of 0.75 W. Also, with customization of the entrance aperture, optical resolution of <1 nm FWHM is possible.
Feb 2011

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absorbance characterizatonAmericasCMOS detectorCzerny Turnerdark measurementsgroove density gratingLED characterizationmicrospectrometersnear-infraredNIROcean OpticsOEMProductsSensors & DetectorsShutterspectroscopySTSTest & Measurementtransmittance characterizationVISvisible

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