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SWIR Cameras for PV Inspection

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PRINCETON, N.J., June 16, 2009 – Sensors Unlimited Inc., part of Goodrich Corp., has introduced high-resolution shortwave infrared (SWIR) area- and line-scan cameras that are used to improve the manufacturing yield of concentrated photovoltaic cells and to monitor the quality of solar thin films and crystalline cells.

Sensors-Unlimited-SWIRCamer.jpgThe InGaAs-based SWIR cameras, which operate between 0.9 and 1.7 µm, are suitable for inspecting silicon boules and wafers due to that material’s transparency beyond 1.2 µm. The cameras reveal voids in silicon boules, bricks, and ingots before they are sliced into wafers to produce mono- and multicrystalline solar cells. They also can detect hidden cracks by mapping stress in raw wafers, finished cells and thin-films made for solar electricity-generating panels, and they can spot saw marks on the opposite side of a silicon wafer and/or defects inside the material.

By applying forward bias to cells to generate electroluminescence, the cameras gauge cell efficiency and uniformity, improving the cell manufacturing process and facilitating matching of cells with similar efficiencies for assembly into modules. The latter step prevents the loss of energy from the stronger cells.

For further information, visit:  

Sensors Unlimited Inc.
3490 Route 1
Building 12
Princeton, N.J. 08540-5914
Phone: (609) 520-0610
Fax: (609) 520-0638
Jun 2009

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area-scanenergygreen photonicsindustrialInGaAs technologyline-scanphotonicsphotovoltaic inspectionProductsSensors & DetectorsSensors Unlimitedsilicon boules inspectionsolar thin filmsSWIR cameraswafer inspection

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