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GENNEVILLIERS, France, May 27, 2011 — For quantitative microanalysis and x-ray imaging at high spatial resolution, Cameca, a unit of Ametek’s Materials Analysis Div., has unveiled the SXFiveFE, a field emission electron probe microanalyzer (FE-EPMA).

Developed for a wide range of micro- and nanoanalytical applications, it combines proven proprietary technology with the latest developments in general-purpose electron probe microanalyzers, including the addition of a field emission source. It features a field emission electron column and the company's high-sensitivity and high-resolution spectrometers.

The instrument is suitable for a range of applications from geochronology, mineralogy and nuclear forensics to materials, thin films and semiconductor research.

The EPMA platform is available in two configurations: SXFive with W and LaB6 sources and SXFiveFE with a field emission source. Both deliver submicron spatial resolution, extending EPMA capabilities to smaller analyzed volumes. Equipped with high-precision spectrometers for good reproducibility, the instrument delivers high-quality minor and trace element analysis, and it offers full automation for long-term unattended analysis.

Published: May 2011
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AmetekBiophotonicsCamecaEuropefield emission electron probe microanalyzerFrancefull automationgeochronologyImagingMaterialsmicroanalysismineralogyminor element analysisnanonanoanalysisnuclear forensicsProductssemiconductor researchSpectrometersspectroscopyTest & Measurementthin filmstrace element analysisunattendedx-ray imagingXSFiveFE

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