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Scan Extension Tool

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EINDHOVEN, Netherlands, Nov. 22, 2016 — Scan Extension ToolJTAG Maps from JTAG Technologies is a simple extension to the Altium Designer tool suite that allows users to thoroughly assess the capabilities of the JTAG/boundary-scan resources on their design before committing to layout.

JTAG Maps for Altium includes an assume scan covered feature, enabling a view of potential boundary-scan coverage without a specific boundary scan description language. The feature can also be used to indicate fault coverage to a connector to highlight the differences in fault coverage between two equivalent parts — one with and one without built-in JTAG/boundary-scan.

For engineers wishing to apply JTAG/Boundary-scan tests directly onto their design, JTAG Technologies can offer two further options: JTAG Live for low-cost functional testing with boundary-scan, and JTAG ProVision, a full-blown automated test program generation and device programming system.


Photonics.com
Nov 2016
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ProductsJTAG MapsJTAG TechnologiesAltiumEuropeimagingTest & Measurementoptics

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