Search
Menu
Gentec Electro-Optics Inc   - Measure With Gentec Accuracy LB

Beam Profiler

MKS Ophir, Light & MeasurementRequest Info
 
Facebook X LinkedIn Email
Scanning-Slit Beam ProfilerOphir Photonics, part of Newport Corp., has announced the NanoScan 2s, a high-power, scanning-slit beam profiler.

The NIST-calibrated profiler instantly measures beam position and size with submicron precision for CW and kilohertz-pulsed lasers. It offers silicon, germanium or pyroelectric detectors, which allow profiling lasers of any wavelength from UV to far-infrared, 100 μm and beyond.

Moving slits measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts. A digital controller provides deep, 16-bit digitization of the signal for high dynamic range up to 35 dB, making it possible to measure beam size and beam pointing with 3σ precision to several hundred nanometers.

NanoScan 2s software can measure between 1 and 16 beams in the aperture with submicron precision. A beam can be found in less than 0.3 seconds, with real-time updates displayed at 20 Hz.


Published: November 2015
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to MKS Ophir, Light & Measurement by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Productspulsed lasersOphirNanoScan 2sbeam profilerAmericasUtahLasersTest & Measurement

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.