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Scanning Electron Microscope

JEOL USA Inc.Request Info
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The InTouchScope scanning electron microscope (SEM) from JEOL USA Inc. features a multitouch interface. The analytical, low-vacuum instrument features integrated energy-dispersive spectroscopy analysis with the latest silicon drift detector technology. The intuitive multitouch screen interface puts all SEM apps at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters and analytical functions, or measure distances just by tapping the PC or notebook touch screen. Functions include automatic SEM condition setup based on sample type; simultaneous multiple live image and movie capture; easy sample navigation at 5x to 300,000x magnifications; quantitative and qualitative elemental analysis; low- and high-vacuum operation; and wireless capability.

Photonics Spectra
Nov 2010

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Displaysenergy-dispersive spectroscopy analysisInTouchScopeJEOLJEOL USA imageMicroscopymovie capturemultitouch interfaceNew Productsopticsscanning electron microscopeSEMSEM condition setupSensors & Detectorssilicon drift detectorspectroscopy analysiswireless capability

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