Scanning Electron Microscope
Photonics Spectra
Nov 2010JEOL USA Inc.Request Info
The InTouchScope scanning electron microscope (SEM) from JEOL
USA Inc. features a multitouch interface. The analytical, low-vacuum instrument
features integrated energy-dispersive spectroscopy analysis with the latest silicon
drift detector technology. The intuitive multitouch screen interface puts all SEM
apps at the operator’s fingertips. The user can expand windows and images
with the sweep of two fingers, dial in magnification and focus with a swipe, and
select operating parameters and analytical functions, or measure distances just
by tapping the PC or notebook touch screen. Functions include automatic SEM condition
setup based on sample type; simultaneous multiple live image and movie capture;
easy sample navigation at 5x to 300,000x magnifications; quantitative and qualitative
elemental analysis; low- and high-vacuum operation; and wireless capability.
https://www.jeolusa.com
https://www.photonics.com/Buyers_Guide/JEOL_USA_Inc/c7365