Scanning Electron Microscope

Carl Zeiss AG, Camera LensesRequest Info
Facebook X LinkedIn Email
OBERKOCHEN, Germany, Sept. 14, 2016 — Carl Zeiss AG has announced the Sigma HD VP scanning electron microscope with field emission FE-SEM technology.

Ideal for failure analysis of materials and manufactured components, imaging and analysis of steels and metals, and semiconductor and electronics quality assurance, the Sigma HD VP is also an excellent choice for medical device inspection.

EDS geometry delivers high analytical performance. Featuring high vacuum and variable pressure operation modes for high-definition imaging of conducting and nonconducting samples, the SIGMA HD increases resolution to 1 nm.

Published: September 2016
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:

When you click "Send Request", we will record and send your personal contact information to Carl Zeiss AG, Camera Lenses by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsCarl ZeissSigma HD VPscanning electron microscopeEurope

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.