Scanning probe
Veeco Instruments Inc.Request Info
Veeco Instruments Inc. designed the Multimode
V and Dimension V scanning probe microscopes to measure small and large objects,
respectively. They can measure characteristics such as topography, elasticity and
friction with scanning tunneling microscopy and atomic force microscopy. They feature
software designed for new or infrequent users of such microscopes and architecture
that is compatible with various programming languages. The instruments contain the
Nanoscope V controller, enabling thermal tuning of cantilever resonances up to 2
MHz and the simultaneous capture of up to eight images at a frequency of 50 MHz
and a resolution of 5000 x 5000 pixels.
https://www.veeco.com
/Buyers_Guide/Veeco_Instruments_Inc/c15663
Published: September 2006
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