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Zaber Technologies - Nucleus Modular Microscopy Platform LB 1/26

Scratch-Dig Evaluation System

The OptiLux SD from RedLux Ltd. is a scratch-dig evaluation system that eliminates operator subjectivity.

Offering reduced cycle times, the system features a sensor head and an innovative precision XY motion system, providing a fully-automated operator-independent, surface measurement and analysis procedure.

The OptiLux SD provides automated measurement and evaluation of the entire clear aperture according to MIL-PRF-13830B. It is calibrated with compliant visibility comparison standards, providing comprehensive PDF reporting with clear aperture overview and pass/fail status.

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Published: December 2016

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