Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
Photonics Media
ABOUT US
BOOKSTORE
SUBSCRIBE
ADVERTISE
Facebook Twitter Instagram LinkedIn YouTube RSS
More News
share
Email Facebook Twitter Google+ LinkedIn

Sensor System

EuroPhotonics
Oct 2011Armstrong Optical Ltd.Request Info
 
A noncontact high-precision sensor that provides thickness measurement of infrared silicon and other semiconductor substrate wafers, doped or undoped, has been unveiled by Precitec Optronik and is available through Armstrong Optical Ltd. The CHRocodile IT sensor system is based on laser diode technology and offers thickness measurement from 18 µm to 3 mm in air, with a resolution of better than 60 nm for silicon. It performs in-line measurements at a 4-kHz sampling rate and can operate in a vacuum. Measurement is independent of variations in temperature and atmospheric moisture, making the system suitable for many industrial applications. The easily integrated sensor head measures <20 mm in diameter and is <50 mm long.

Visit company website
About this supplier

explore related content
REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Armstrong Optical Ltd. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
more related
YOU MAY ALSO LIKE...
Night Vision Goggle Tester
Intelligent Software and Sensor
Rail Measurement Module
Well Plate Robotic Loader
MORE FROM PHOTONICS MEDIA
Europe
Fusion Core
Sensors & Detectors
Polarization Cameras
Test & Measurement
Bed-of-Nails Testers
industrial
CMOS Image Sensor
Photonics Buyers' Guide
Browse Cameras & Imaging, Lasers, Optical Components, Test & Measurement, and more.
Armstrong OpticalCHRocodile IT sensor systemdoped wafer thickness measurementEnglandEuropein-line wafer thickness measurementindustrialinfrared silicon wafer thickness measurementnoncontact thickness measurementpassive lens systemPrecitec OptronikProduct Previewsemiconductor substrate wafer thickness measurementSensors & DetectorsTest & Measurementundoped wafer thickness measurement

Terms & Conditions Privacy Policy About Us Contact Us
Our Publications Photonics Spectra BioPhotonics Industrial Photonics EuroPhotonics Photonics Showcase Photonics Buyers' Guide Photonics Handbook Photonics Dictionary E-Newsletters
Sections News Features Products White Papers Media Light Matters Newscast Webinars Events & Courses Calendar
Browse by Subject Lasers Optics Imaging Biophotonics Industrial Sensors & Detectors Test & Measurement Light Sources Fiber Optics Spectroscopy Microscopy Materials & Coatings
Services Subscribe Login Register Advertise Submit a Press Release List in the Buyers' Guide Buy Wall Charts Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x Subscribe to EuroPhotonics magazine - FREE!
X
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to Armstrong Optical Ltd. so they may respond to your inquiry directly.

Email Address:
Name:
Company:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.