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Sequential Wavelength Dispersive Fluorescence Spectrometer

Photonics.com
Aug 2017
Rigaku Americas Corp.
 
TOKYO, Aug. 2, 2017 — Sequential Wavelength Dispersive Fluorescence SpectrometerThe ZSX Primus 400 sequential wavelength dispersive x-ray fluorescence spectrometer from Rigaku Corp. is designed to handle large or heavy samples and offer micro-mapping capabilities.

Such analyzers are notable for high sensitivity and spectral resolution for nondestructive elemental analysis. Accepting samples up to 400 mm in diameter, 50 mm thick and 30 kg in mass, the new system is ideally suited for analyzing sputtering targets, magnetic disks, multilayer film metrology or elemental analysis of large samples. All analytical capabilities of a traditional instrument are retained in this large sample variant including measurement of beryllium through uranium with high resolution and precise spectroscopic examination of samples from solids to liquids and powders to thin films.

For added flexibility, the new instrument offers a customized sample adapter system. With a variable measurement spot and mapping capability with multipoint measurements to check for sample uniformity, the instrument was engineered to streamline quality control processes.


ProductsZSX Primus 400sequential wavelength dispersive X-ray fluorescence spectrometerspectroscopymetrologyRigakuAsia-Pacificindustrial

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