Silicon CCD High-Resolution Camera
MKS Instruments Inc.Request Info
ANDOVER, Mass., Sept. 3, 2018 — 
MKS Instruments Inc. has announced the Ophir SP920G GigE Silicon CCD High-Resolution Camera designed specifically for industrial laser beam profiling applications.
The camera accurately captures and analyzes wavelengths from 190 to 1100 nm. It features a compact design, wide dynamic range, unparalleled signal-to-noise ratio, and high-speed GigE interface. The SP920G is ideal for measuring continuous-wave and pulsed laser profiles in such high-speed applications as laser cutting of medical devices or welding of dissimilar materials.
The SP920G beam profiling camera leverages the benefits of higher speed combined with industry standard Ethernet’s ready availability, broad compatibility, and lower cost. The camera delivers 1624- ×1224-pixel resolution with a 4.4-µm pixel pitch for measuring beam widths of 44 µm to 5.3 mm and includes a photodiode sync to capture scattered laser light at even the most challenging nanosecond pulse rates.
https://www.mksinst.com
https://www.photonics.com/Buyers_Guide/MKS_Instruments_Inc/c9729
Photonics.com
Sep 2018