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Silicon Drift Detectors

EDAX Inc., Materials Analysis Div.Request Info
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Edax Inc. has unveiled the XLT Apollo silicon drift detector series for transmission electron microscopes. The series includes the Super Ultra Thin Window version and the XLTW windowless version. Data acquisition and signal processing electronics are fully integrated into the detector. The Apollo XLT detector eliminates the need for a separate electronics enclosure for signal processors. It improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer, according to the company. The series offers high collection efficiency with its 30 mm2 sensor. The windowless version maximizes the collection efficiency and improves sensitivity up to 500% for low-energy x-rays. The series is offered with Team energy-dispersive spectroscopy software.

Mar 2011

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AmericasApollo XLT SDDApollo XLT SUTWApollo XLTWBiophotonicsBreakthroughProductsEdaxelectron microscopyenergy dispersive spectroscopyimagingMicroscopySDDSensors & Detectorssilicon drift detectorTEMtransmission electron microscopyx-ray microanalysisx-rays

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