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Silicon Photonics Test System

Keysight Technologies Inc.Request Info
 
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SANTA ROSA, Calif., Oct. 1, 2021 — Silicon Photonics Test SystemThe NX5402A Silicon Photonics Test System from Keysight Technologies Inc. is integrated with PathWave Semiconductor Test software technology to enable the speedy delivery of silicon photonics wafer production with stable and repeatable test capabilities for semiconductor manufacturing.

The system provides measurement technology and direct support including integrated optical and electrical test capabilities, and fiber alignment and positioning systems. Full automation eliminates manual operation with PathWave Semiconductor Test software, which is compatible with SPECS software, enabling one-pass silicon photonics testing. Factory automation software, safety interlock, and cleanroom features support manufacturing use and high-throughput testing based on multichannel optical and electrical test architecture, as well as optimized fiber alignment.

High accuracy, repeatability, and reproducibility are provided from laboratory to fabrication, delivering advanced wafer-level photonic calibration and reliable performance monitoring with built-in automatic system diagnostics.


Photonics.com
Oct 2021
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ProductsSilicon Photonics Test SystemNX5402AKeysight Technologiessilicon photonicstext & measurementsemiconductorsWafersopticsindustrialAmericas

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