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SpecEl-2000-VIS Ellipsometer

Ocean Insight
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DUNEDIN, Fla., Dec. 18, 2006 -- Ocean Optics announced that its Mikropack office in Germany has introduced the SpecEl-2000-VIS, a compact, easy-to-use, benchtop spectroscopic ellipsometer for thin-film measurement. According to the company, the instrument is ideal for semitransparent flat samples such as wafers and glass plates. It provides fast, precise measurement of layer thickness, refractive index, absorption and components ratio at the touch of a button.

SpecEl.jpgHalf the price of standard spectroscopic ellipsometry equipment, the all-in-one system has a footprint of only 52 x 33 x 24 cm and features an integrated light source, spectrometer and two polarizers. It comes with a 32-bit Windows PC featuring easy-to-use software and measures polarized light reflected from the surface of the substrate to determine the thickness and the refractive index of the material as a function of wavelength.

Depending on the layer and substrate material, the SpecEl can detect layer thickness between 1 nm and 5 µm, and refractive indices over the full 450-900 nm spectral range. Analysis is carried out within seconds of placing a sample on the wafer-chuck.

The software enables experiment methods to be configured and saved for one-step analysis. The powerful analysis software provides a range of modeling possibilities such as Cauchy, OJL, Tauc-Lorentz, Drude, EMA and different types of oscillators.

Compared to reflectometry, spectroscopic ellipsometry measures relative changes in the phase and amplitude of the light instead of absolute intensity. Ellipsometry’s independence from any reference measurement allows multiple parameters to be determined simultaneously.

For more information, visit:; e-mail:

Ocean Optics Inc.
830 Douglas Ave.
Dunedin, FL 34698
Phone: (727) 733-2447
Fax: (727) 733-3962
Dec 2006
amplitudeanalysisellipsometerellipsometryEmploymentglass platesOcean OpticsphotonicsProductssemitransparentSpecEl-2000-VISspectroscopicspectroscopythin-film

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