Spotlight 400 FT-IR Imaging System

PerkinElmer

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Spotlight™ IR microscope systems are designed to meet the challenges of an expanding laboratory by generating high-quality, reproducible data from a variety of sample types. The Spotlight 400 FT-IR Imaging System combines high sensitivity and rapid imaging with ease-of-use. The ability to image large sample areas rapidly at high spatial resolution extends FT-IR microscopy into new applications. The powerful software suite that drives the Spotlight 400 system and can support advanced FT-IR analysis in research and industrial laboratories, always providing optimal results.

The software supplied with the system gives you full control over the microscope including the focusing on the sample, illumination, stage position, changing between sampling modes, and manipulating the spectra that you collect. The spectrometers can operate in ratio, single-beam, or interferogram mode. SpectrumIMAGE software enables control over the imaging system with the ability to view sample images with ease in real time. With Spectrum MultiSearch, identification of unknown mixtures is made simple through the use of comparison algorithms allowing for the separation and library matching of up to 10 components.

A variety of optional accessories and consumables are available for use with the Spotlight systems, such as an infrared polarizer kit, heated stage accessory, crystal compression cells, and a micro-sampling tool kit for ease with sample handling and preparation.

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