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Stochastic Measurement Device

Fractilia LLCRequest Info
 
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AUSTIN, Texas, March 6, 2023 — Stochastic Measurement DeviceThe FAME 300 from Fractilia LLC provides real-time measurement, detection, and monitoring of stochastic defects, helping high-volume manufacturing facilities identify potential process problems within minutes.

The platform leverages a scalable, Kubernetes cluster-based architecture to achieve the throughput needed to measure all images across the fabrication. Applications include R&D and process development environments among semiconductor manufacturers, equipment companies, and materials suppliers in lot dispositioning, real-time excursion detection, edge placement error optimization, lithography, etch process tool monitoring, and more.


Photonics.com
Mar 2023
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ProductsFractiliaFAME 300Stochastic Measurement DeviceTest & MeasurementindustrialR&DmaterialsAmericas

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