Thin-Film Metrology System

k-Space Associates Inc.Request Info
Facebook X LinkedIn Email
Thin Film Metrology SystemThe kSA XRF (X-ray fluorescence) tool from k-Space measures film thicknesses below 100 nanometers for applications in coated glass and solar panels. The system uses an X-ray source, detector, and proprietary software to measure the X-ray emission spectrum, which is then used to calculate film thickness in real time. The system can be configured for a standalone benchtop setup or over a conveyor for in-line inspection and manufacturing process control.

Published: March 2023
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:

When you click "Send Request", we will record and send your personal contact information to k-Space Associates Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Productsspectroscopymetrologyglassinspectionsolar panelsx-raykSA XRFk-Space Associatesk-SpaceAmericas

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.