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Thin-Film Metrology System

k-Space Associates Inc.Request Info
 
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Thin Film Metrology SystemThe kSA XRF (X-ray fluorescence) tool from k-Space measures film thicknesses below 100 nanometers for applications in coated glass and solar panels. The system uses an X-ray source, detector, and proprietary software to measure the X-ray emission spectrum, which is then used to calculate film thickness in real time. The system can be configured for a standalone benchtop setup or over a conveyor for in-line inspection and manufacturing process control.

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Photonics Spectra
Jun 2023
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