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USPM-RU III Measurement System

Photonics.com
Jan 2011
Olympus Scientific Solutions Americas, Industrial MicroscopesRequest Info
 
CENTER VALLEY, Pa., Jan. 31, 2011 — Olympus America Inc.’s Scientific Equipment Group is offering a spectral reflectivity measurement system for lens design and manufacturing. The USPM-RU III is used with the lenses, prisms, flat glass, plastics and electronic components designed and produced by optical manufacturers. Fast and simple to use, it provides highly accurate and repeatable measurements of thin samples within seconds.

While other systems require users to take costly steps to prevent rear surface reflection, the system enhances quality control and R&D projects by providing accurate reflectivity measurements without the need for back-side coating. Spherical, aspherical, flat and other surfaces can be accommodated without special costly or time-consuming sample preparation.

The system provides comparison reflectivity measurements for wavelengths ranging from 380 to 780 nm, using a reference specimen. Object color can be measured based on spectrophotometric colorimetry determined from prismatic reflectivity. Display resolution is 1 nm. The light source is a 12-V 100-W halogen lamp, and the PC interface is USB. Z-direction movement range of the stage is 85 mm.


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