Search Menu
Photonics Media Photonics Marketplace Photonics Spectra BioPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook
Advanced Photonix - Extended Visible InGaAs LB

Ultima IV X-ray Diffractometer

Rigaku Americas Corp.Request Info
Facebook Twitter LinkedIn Email
THE WOODLANDS, Texas, Sept. 4, 2007 -- The Ultima IV x-ray diffractometer is an advanced general purpose x-ray diffraction (XRD) instrument for materials science, semiconductor, and nanotechnology research and development, as well as for manufacturing quality assurance applications, according to its maker, Rigaku Americas Corp.

The design features a new high-speed detector for 100 times faster measurements, application flexibility provided by patented Cross Beam Optics (CBO), and a 50 percent smaller size than a conventional XRD system, the company said.

RigakuUltima.jpgA fully optioned Ultima IV can span applications that would have required up to four separate conventional XRD instruments in the past, Rigaku said. A modular "build-up" platform allows users to add additional capabilities as new application requirements arise, including support for high-resolution diffraction, thin-film measurement, microdiffraction and handling very small samples.

Ultima IV is equipped with a unique CBO mechanism that allows user-selectable switching between either a focusing or parallel incident x-ray beam without resetting or realigning the optical system. Both system geometries are permanently mounted and permanently aligned to allow easy changeover for different applications. All other competitive x-ray diffraction systems require system reconfiguration when switching operation of the system between focusing and parallel beam geometries. In addition, new optics for microdiffraction provides data quality close to that provided by a dedicated microdiffraction system.

The Ultima IV, which measures 1100-mm wide, 810-mm deep and 1630-mm high, is also more efficient that a conventional XRD instrument, occupying 50 percent less space and having 20 percent less mass. A reduce footprint means lower facilities overhead for a reduced cost-of-ownership. In addition, the sample stage height is 300 mm lower than a conventional XRD system for ease-of-use, Rigaku said.

For more information, visit:; email: [email protected]

Rigaku Americas Corp.
9009 New Trails Dr.
The Woodlands, TX 77381
Phone: (281) 362-2300
Fax: (281) 364-3628
Sep 2007

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Rigaku Americas Corp. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
BiophotonicsCBOcross beam opticsdiffractiondiffractometerindustrialmaterials sciencemicrodiffractionnanonanotechnologyopticalphotonicsProductsRigakuRigaku AmericassemiconductorsSensors & DetectorsTest & Measurementthin-filmUltimaUltima IVx-rayXRD

back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2022 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.