Search Menu
Photonics Media Photonics Marketplace Photonics Spectra BioPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook

Wafer Measurement System

Nikon Corp., Digital Solutions Business UnitRequest Info
Facebook Twitter LinkedIn Email
The NEXIV VMZ-NWL 200 from Nikon is an automatic wafer measurement system developed to solve the challenges of wafer metrology in the back-end of the semiconductor manufacturing process. The product automatically measures 6-in. or 8-in. wafers held in a carrier according to a measurement program. It is possible to trace when the measurement was performed and by which program, helping to improve traceability. The system is designed with safety in mind and a protective cover is provided to prevent possible damage due to operator error. Operation meets SEMI international standards S2, S8, and F47.

Photonics Spectra
Oct 2023
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:

When you click "Send Request", we will record and send your personal contact information to Nikon Corp., Digital Solutions Business Unit by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsTest & MeasurementSensors & DetectorsautomationSoftwareindustrialsemiconductorsAsia-PacificNikon

back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2023 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

Photonics Media, Laurin Publishing
x Subscribe to Photonics Spectra magazine - FREE!
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.