Search
Menu
DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers
PROMOTED
CONTENT
Promoted content

Wide Beam Imager for SWIR Range

MKS Ophir, Light & MeasurementRequest Info
 
Facebook X LinkedIn Email
Wide Beam Imager for SWIR RangeCurrent methods of profiling wide and divergent beams provide inaccurate results due to the high angle dependence of the sensor, or require bulky and expensive laboratory equipment unsuitable for field operation or production environments. The Ophir WB-I SWIR imager is a compact, calibrated optical system for measuring the size and power distribution of large and divergent beams of VCSELs and LEDs in the SWIR range (900 - 1700 nm). It is capable of imaging any beam shape (round, line, square, doughnut) that is too large for a camera sensor. It features a 45 mm diameter aperture and angle of incidence of 70 degrees (vs 15 degrees for standard beam profilers). Beams are captured on a translucent diffusive screen and re-imaged to produce a complete and accurate mapping of the light's intensity distribution.

The WB-I SWIR imager is designed for use with camera-based beam profiling systems in such areas as eye-safe applications using IR VCSELs or diodes, automotive LIDAR, facial and gesture recognition, and remote sensing. Large or diverging beams present challenges because the apertures of conventional beam profilers are too small to collect the entire spot. Also, the quantum efficiency of traditional beam detectors is highly affected by the angle of incidence. The quantum efficiency recedes dramatically with angles of incidence as high as 20 degrees, causing significant measurement errors. The WB-I SWIR can handle beam angles up to 70 degrees. It captures the beam and images its power distribution onto the camera with high accuracy.

The WB-I SWIR imager is supported by Ophir BeamGage Professional software, the industry's most advanced beam analysis system. When used together, the WB-I SWIR imager, BeamGage software, and Ophir SP1203 InGaAs camera can provide real-time beam shape analysis and visualization. That means changes of the beam shape due to different applied currents can easily be detected.


REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to MKS Ophir, Light & Measurement by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsImagingbeam profilerLaser beam detectorwide laser beamsdivergent laser beamsVCSELLEDlidar

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.