Search Menu
Photonics Media Photonics Marketplace Photonics Spectra BioPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook

X-ray diffractometer

Rigaku Americas Corp.Request Info
Facebook Twitter LinkedIn Email
RigakuAmericas.jpgRigaku Americas Corp. has unveiled the Ultima IV x-ray diffractometer, an instrument suitable for materials science and for semiconductor and nanotechnology research. The features include a high-speed detector, application flexibility and a low sample-stage height in an 1100 × 810 × 1630-mm design. Equipped with a Cross Beam Optics mechanism, the device enables users to switch between focusing and parallel incident x-ray beams without resetting the optical system. Geometries are mounted permanently and aligned for simple application changes. A modular buildup platform allows users to increase capabilities as needs arise. Support for high-resolution diffraction, thin-film measurement, microdiffraction and the handling of very small samples can be added.

Dec 2007
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:

When you click "Send Request", we will record and send your personal contact information to Rigaku Americas Corp. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

BiophotonicsBreakthroughProductsnanotechnologyRigaku Americas Corp.semiconductorsSensors & Detectorsx-ray diffractometer

back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2023 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

Photonics Media, Laurin Publishing
x Subscribe to BioPhotonics magazine - FREE!
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.