Search
Menu
Rocky Mountain Instruments - Infrared Optics LB

afm+ AFM Platform

Anasys Instruments Corp.Request Info
 
Facebook X LinkedIn Email
Anasys Instruments Corp. has launched an easy-to-use research and analysis tool. The afm+ is a fully integrated atomic force microscopy (AFM) platform that offers three important analytical capabilities.

Using proprietary thermal probe technology for nanoscale thermal analysis (nano-TA), the afm+ allows the user to obtain transition temperatures on any local feature of a sample, or to obtain a transition temperature map. It facilitates measurement of glass transition temperatures and melting temperatures. This mode also includes scanning thermal microscopy, which allows the user to map relative thermal conductivity and relative temperature differences across the sample.

Transition temperature microscopy is used to quantify and map thermal transitions in heterogeneous materials. It is a fully automated mode in which an array of nano-TA measurements is rapidly performed, and each temperature ramp is automatically analyzed to determine the transition temperature.

The afm+ is fully upgradable to perform infrared spectroscopy for measuring and mapping chemical composition on the nanoscale. This technology enables point-and-click nanoscale IR spectroscopy that produces IR spectra correlating to Fourier transform infrared libraries. This makes chemical imaging on the nanoscale a reality. The upgrade options also include the ability to measure the mechanical properties of samples. Data may be collected using a contact resonance method to map stiffness variations simultaneously with the topography.

The system provides the basis for a multifunctional nanoscale measurement suite. It is fully upgradable to the Anasys nanoIR system, a probe-based measurement tool that uses infrared spectroscopy to reveal chemical composition at the nanoscale. The nanoIR also provides high-resolution characterization of local topographic, mechanical and thermal properties. Potential applications include polymer science, materials science and life sciences, including detailed studies of structure-property correlations.


Published: December 2011
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Anasys Instruments Corp. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

AFM materials scienceAFM measure glass melting temperaturesAFM measure glass transition temperaturesAFM measure mechanical propertiesAFM measure thermal propertiesAFM measure topographic propertiesAFM polymer scienceAFM study structure-property correlationsafm+AmericasAnasys InstrumentsAnasys nanoIR systematomic force microscope nano-TA measurementsatomic force microscopy life sciencesatomic force microscopy platformBasic ScienceBiophotonicsCaliforniaIR spectra correlate to Fourier transform infrared librariesIR spectra correlate to FTIR librariesMicroscopynanonanoscale chemical imagingnanoscale infrared spectroscopynanoscale thermal analysisOpticsProductsscanning thermal microscopyTest & Measurementthermal probe technology

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.