afm+ AFM Platform
Anasys Instruments Corp.Request Info
SANTA BARBARA, Calif., Dec. 6, 2011 — Anasys Instruments Corp. has launched an easy-to-use research and analysis tool. The afm+ is a fully integrated atomic force microscopy (AFM) platform that offers three important analytical capabilities.
Using proprietary thermal probe technology for nanoscale thermal analysis (nano-TA), the afm+ allows the user to obtain transition temperatures on any local feature of a sample, or to obtain a transition temperature map. It facilitates measurement of glass transition temperatures and melting temperatures. This mode also includes scanning thermal microscopy, which allows the user to map relative thermal conductivity and relative temperature differences across the sample.
Transition temperature microscopy is used to quantify and map thermal transitions in heterogeneous materials. It is a fully automated mode in which an array of nano-TA measurements is rapidly performed, and each temperature ramp is automatically analyzed to determine the transition temperature.
The afm+ is fully upgradable to perform infrared spectroscopy for measuring and mapping chemical composition on the nanoscale. This technology enables point-and-click nanoscale IR spectroscopy that produces IR spectra correlating to Fourier transform infrared libraries. This makes chemical imaging on the nanoscale a reality. The upgrade options also include the ability to measure the mechanical properties of samples. Data may be collected using a contact resonance method to map stiffness variations simultaneously with the topography.
The system provides the basis for a multifunctional nanoscale measurement suite. It is fully upgradable to the Anasys nanoIR system, a probe-based measurement tool that uses infrared spectroscopy to reveal chemical composition at the nanoscale. The nanoIR also provides high-resolution characterization of local topographic, mechanical and thermal properties. Potential applications include polymer science, materials science and life sciences, including detailed studies of structure-property correlations.
http://www.anasysinstruments.com
https://www.photonics.com/Buyers_Guide/Anasys_Instruments_Corp/c17213
Photonics.com
Dec 2011