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atomic force microscopy News
Real-Time Monitoring of AFM Probes
BOULDER, Colo., April 5, 2011 — A new way to measure the degradation of ultrasmall probes in situ and as it is happening promises to dramatically speed up and improve the accuracy of atomic force microscopy (AFM). If you are trying to measure the contours of a surface with a ruler that is crumbling away as you work, then you at least need to know how fast and to what extent it is being worn away during the measurement. This has been the challenge for researchers and manufacturers trying to create images of the surfaces...
Photonics marches steadily forward in southern climes
TONANTZINTLA, Mexico – Photonics research and development occurs all over the world, but in North America it is chiefly in the US and Canada that the industry flourishes. That said, all is not quiet in Mexico and its neighbors to the south. Throughout Mexico and Central...
SPM Workshop Announced
SANTA BARBARA, Calif., Feb. 23, 2011 — The Max Planck Institute for Polymer Research (MPI-P) and Asylum Research, a manufacturer of scanning probe/atomic force microscopy (SPM/AFM) equipment, are co-organizing the 2nd International Workshop for Scanning Probe Microscopy for Energy...
A nanoscale look at how lithium batteries work
OAK RIDGE, Tenn. – A new type of scanning probe microscopy that can visualize electrochemical strain has enabled scientists to study the movement of ions in the cathode material of lithium-ion batteries, an approach that not only offers a better understanding of the...
Unprecedented Spatially Resolved Chemical Analysis Via Nanoscale Spectroscopy
Dec 1, 2010 — The phrase “lab on a tip,” referring to nanoscale property measurements made by the probe of an atomic force microscope (AFM), has been a dream for the developers of analytical instrumentation. There also has been a drive for...
Microscope Aids Study of Single Molecules
AMES, Iowa, Nov. 29, 2010 — By combining atomic force microscopy (AFM) and Förster resonance energy transfer (FRET) technologies, a researcher at Iowa State University has developed new approach toward single-molecule microscopy. Sanjeevi Sivasankar was looking for a...
PI Releases Catalog
AUBURN, Mass., Nov. 10, 2010 — PI (Physik Instrumente) L.P., a manufacturer of piezo ceramic actuators and precision motion-control equipment for semiconductor, biomedical and nanotechnology applications, has released a new catalog on piezo mechanisms. The 400-page catalog...
Procedure Produces Sharper AFM Probes
JENA, Germany, Nov. 2, 2010 — Scientists from Friedrich-Schiller-University Jena were successful in improving a fabrication process for atomic force microscopy (AFM) probe tips. Stephanie Hoeppener is working with an atomic force microscope for which a Jena research team...
Asylum Research to Take AFM on Tour
SANTA BARBARA, Calif., Oct. 21, 2010 — Asylum Research, a manufacturer of scanning probe and atomic force microscopy (SPM/AFM) equipment, has announced that it will conduct a tour throughout the UK and Ireland over the coming months to bring its Cypher AFM to leading universities across...
Asylum Research Offers AFM Class
SANTA BARBARA, Calif., Sept. 28, 2010 — Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its AFM in Biology class to be held Nov. 3-5, 2010, in Santa Barbara. The class is open to all AFM users who want to increase their knowledge of the...
Elliot Scientific Named Mad City Rep in UK, Ireland
HARPENDEN, England, Sept. 9, 2010 — Mad City Labs Inc. announced recently the appointment of Elliot Scientific Ltd. as the distributor of its products within the UK and Ireland. The manufacturer of flexure-based nanopositioning systems capable of subnanometer positioning...
JPK Announces Annual Meeting
BERLIN, Aug. 12, 2010 — Nanoanalytic instrument maker JPK Instruments has announced that registration is open for the ninth annual international symposium on the applications of scanning probe microscopy and optical tweezers. The meeting will be held Oct. 6 to 7 in...
PI Releases Actuators Brochure
AUBURN, Mass., July 20, 2010 — Piezo ceramic actuator and precision motion-control equipment provider PI (Physik Instrumente) LP released a new brochure for its lever amplified piezo flexure actuators. The brochure features a variety of newly designed flexure actuators for OEMs,...
Veeco Hosts Webinar on Surface Profilometry
TUCSON, Ariz., June 15, 2010 — As part of its ongoing series of live webinars on three-dimensional, non-contact surface profilometry, Veeco Instruments Inc. will host a free online seminar titled, “Non-Contact, 3-D Optical Surface Profilometry for Ophthalmic...
BE Technique Reveals ‘Rayleigh Behaviors’
SANTA BARBARA, Calif., May 21, 2010 — The revolutionary new Band Excitation (BE) technique, co-developed by Oak Ridge National Laboratory (ORNL) and Asylum Research, has provided clues to the origins of unique properties of materials including spin and cluster glasses, phase-separated...
CEA-Leti Project Aims to Improve Sub-28nm Node Yields
GRENOBLE, France, April 8, 2010 — CEA-Leti, a global research center committed to creating and commercializing innovation in micro- and nanotechnologies, announced that its Hybrid Metrology Project has developed a way to reduce measurement uncertainty in the sub-28nm nodes. ...
Asylum, ORNL to Hold SPM Workshop
SANTA BARBARA, Calif., April 6, 2010 — The Center for Nanophase Materials Sciences at Oak Ridge National Laboratory (ORNL) and Asylum Research are co-organizing the International Workshop for Scanning Probe Microscopy for Energy Applications, to be held at ORNL Sept. 15-17, 2010. The...
Asylum’s Band Excitation Technique Grants Awarded
SANTA BARBARA, Calif., March 29, 2010 — Asylum Research, manufacturer of scanning probe and atomic force (SPM/AFM) microscopes, has announced eight new grants for early adopters to explore the capabilities and applications of a new band excitation (BE) technique. The R&D100...
LLNL Mirrors Used for Solar Mission
LIVERMORE, Calif., March 15, 2010 — A technology originally developed to make computer chips smaller, faster and more powerful is now being used in space to take images of the sun every 10 seconds with 10 times better resolution that high-definition television.
Diamond-like Carbon Tip Formed
PHILIDELPHIA, Penn., Feb. 26, 2010 – Researchers have fabricated an ultra sharp, diamond-like carbon tip possessing such high strength that it is 3000 times more wear-resistant at the nanoscale than silicon. The end result is a diamond-like carbon material mass-produced at the...
Agilent Acquires Novelx
SANTA CLARA, Calif., Jan. 25, 2010 - Novelx, a Lafayette, Calif.-based maker of field emission scanning electron microscopes (SEMs), has been acquired by measurement company Agilent Technologies for an undisclosed amo...
Fluorescein Images Graphene
EVANSTON, Ill., Dec. 28, 2009 – Researchers at Northwestern University used the dye fluorescein to create an imaging technique to view graphene, a one-atom-thick sheet that could be used to produce low-cost carbon-based transparent and flexible electronics.
Asylum Orders Surge 60% in Q3
SANTA BARBARA, Calif., Oct. 2, 2009 -- Atomic force and scanning probe microscope maker Asylum Research said its orders for the third quarter are up more than 60 percent, driven largely by the introduction of a new high-resolution AFM, the popularity of two MFP-3D™ AFMs and the...
Reflecting on the Past
Sep 1, 2009 — One source rarely considered when addressing photonics issues is our ancestors: Great technological discoveries from many millennia ago may lead to modern day solutions. A recent example of this involves optimizing gold-based infrared reflectors...
Molecule’s ’Anatomy’ Imaged
ZURICH, Switzerland, Aug. 31, 2009 -- The chemical structure inside a molecule has been imaged with unprecedented resolution through the use of noncontact atomic force microscopy. Imaging individual atoms within a molecule has been a long-standing goal of surface microscopy. The results...
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May 2024
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